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Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration
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Testability Concepts for Digital ICs - The Macro Test Approach (Hardcover, 1995 ed.)
Loot Price: R4,128
Discovery Miles 41 280
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Testability Concepts for Digital ICs - The Macro Test Approach (Hardcover, 1995 ed.)
Series: Frontiers in Electronic Testing, 3
Expected to ship within 18 - 22 working days
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Throughout the 1980s and 1990s, the theory and practice of testing
electronic products has changed considerably. Quality and testing
have become inextricably linked and both are fundamental to the
generation of revenue to a company, helping the company to remain
profitable and therefore survive. Testing plays an important role
in assessing the quality of a product. The tester acts as a filter,
separating good products from bad. Unfortunately, the tester can
pass bad products and fail good products, and the generation of
high quality tests has become complex and time consuming. To
achieve significant reduction in time and cost of testing, the role
and responsibility of testing has to be considered across an entire
organization and product development process. Testability Concepts
for Digital ICs: The Macro Test Approach considers testability
aspects for digital ICs. The strategy taken is to integrate the
testability aspects into the design and manufacturing of ICs and,
for each IC design project, to give a precise definition of the
boundary conditions, responsibilities, interfaces and
communications between persons, and quality targets. Macro Test, a
design-for-Testability approach, provides a manageable test program
route. Using the Macro Test approach, one can explore alternative
solutions to satisfy pre-defined levels of performance (e.g. defect
detection, defect location, test application) within a pre-defined
cost budget and time scale. Testability Concepts for Digital ICs is
the first book to present a tried and proven method of using a
Macro approach to testing complex ICs and is of particular interest
to all test engineers, IC designers and managers concerned with
producing highquality ICs.
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