With the growing proliferation of nanotechnologies, powerful
imaging technologies are being developed to operate at the
sub-nanometer scale. The newest edition of a bestseller, the
Handbook of Charged Particle Optics, Second Edition provides
essential background information for the design and operation of
high resolution focused probe instruments. The book's unique
approach covers both the theoretical and practical knowledge of
high resolution probe forming instruments. The second edition
features new chapters on aberration correction and applications of
gas phase field ionization sources. With the inclusion of
additional references to past and present work in the field, this
second edition offers perfectly calibrated coverage of the field's
cutting-edge technologies with added insight into how they work.
Written by the leading research scientists, the second edition of
the Handbook of Charged Particle Optics is a complete guide to
understanding, designing, and using high resolution probe
instrumentation.
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