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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > Fibre optics

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Microprobe Characterization of Optoelectronic Materials (Hardcover) Loot Price: R13,309
Discovery Miles 133 090
Repayment Terms: R1,247 pm x 12*
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Microprobe Characterization of Optoelectronic Materials (Hardcover): Juan Jimenez

Microprobe Characterization of Optoelectronic Materials (Hardcover)

Juan Jimenez

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Loot Price R13,309 Discovery Miles 133 090 | Repayment Terms: R1,247 pm x 12*

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Each chapter in this book is written by a group of experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic techniques for device degradation. Different types of probes are considered (electrons, photon and tips) and different microscopies (optical, electron microscopy and tunneling). It's an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

General

Imprint: Crc Press
Country of origin: United States
Release date: November 2002
First published: 2002
Authors: Juan Jimenez
Dimensions: 229 x 152 x 45mm (L x W x T)
Format: Hardcover
Pages: 689
ISBN-13: 978-1-56032-941-1
Categories: Books > Science & Mathematics > Physics > Electricity, magnetism & electromagnetism
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > Fibre optics
LSN: 1-56032-941-6
Barcode: 9781560329411

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