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Failure Analysis of Integrated Circuits - Tools and Techniques (Paperback, Softcover reprint of the original 1st ed. 1999) Loot Price: R4,550
Discovery Miles 45 500
Repayment Terms: R426 pm x 12*
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Failure Analysis of Integrated Circuits - Tools and Techniques (Paperback, Softcover reprint of the original 1st ed. 1999):...

Failure Analysis of Integrated Circuits - Tools and Techniques (Paperback, Softcover reprint of the original 1st ed. 1999)

Lawrence C. Wagner

Series: The Springer International Series in Engineering and Computer Science, 494

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Loot Price R4,550 Discovery Miles 45 500 | Repayment Terms: R426 pm x 12*

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Failure Analysis of Integrated Circuits - Tools and Techniques (Paperback, Softcover reprint of the original 1st ed. 1999):...
Failure Analysis of Integrated Circuits…
R4,550
Against Period Poverty:
Against Period Poverty
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Total price: R4,570
Discovery Miles: 45 700
Terms: R428 pm x 12*
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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: The Springer International Series in Engineering and Computer Science, 494
Release date: November 2012
First published: 1999
Editors: Lawrence C. Wagner
Dimensions: 235 x 155 x 14mm (L x W x T)
Format: Paperback
Pages: 255
Edition: Softcover reprint of the original 1st ed. 1999
ISBN-13: 978-1-4613-7231-8
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN: 1-4613-7231-3
Barcode: 9781461372318

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