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Progress in Nano-Electro Optics IV - Characterization of Nano-Optical Materials and Optical Near-Field Interactions (Hardcover, 2005 ed.) Loot Price: R4,704
Discovery Miles 47 040
Progress in Nano-Electro Optics IV - Characterization of Nano-Optical Materials and Optical Near-Field Interactions (Hardcover,...

Progress in Nano-Electro Optics IV - Characterization of Nano-Optical Materials and Optical Near-Field Interactions (Hardcover, 2005 ed.)

Motoichi Ohtsu

Series: Springer Series in Optical Sciences, 109

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Loot Price R4,704 Discovery Miles 47 040 | Repayment Terms: R441 pm x 12*

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This volume focuses on the characterization of nano-optical materials and optical near-field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Optical Sciences, 109
Release date: February 2005
First published: 2005
Editors: Motoichi Ohtsu
Dimensions: 235 x 155 x 14mm (L x W x T)
Format: Hardcover
Pages: 208
Edition: 2005 ed.
ISBN-13: 978-3-540-23236-0
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
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LSN: 3-540-23236-2
Barcode: 9783540232360

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