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Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings (Paperback, 2008 ed.)
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Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings (Paperback, 2008 ed.)
Series: Lecture Notes in Computer Science, 5342
Expected to ship within 10 - 15 working days
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This volume in the Springer Lecture Notes in Computer Science
(LNCS) series contains 98 papers presented at the S+SSPR 2008
workshops. S+SSPR 2008 was the sixth time that the SPR and SSPR
workshops organized by Technical Committees, TC1 and TC2, of the
International Association for Pattern Rec- nition (IAPR) wereheld
as joint workshops. S+SSPR 2008was held in Orlando, Florida, the
family entertainment capital of the world, on the beautiful campus
of the University of Central Florida, one of the up and coming
metropolitan universities in the USA. S+SSPR 2008 was held during
December 4-6, 2008 only a few days before the 19th International
Conference on Pattern Recog- tion(ICPR2008), whichwasheldin Tampa,
onlytwo hoursawayfromOrlando, thus giving the opportunity of both
conferences to attendees to enjoy the many attractions o?ered by
two neighboring cities in the state of Florida. SPR 2008 and SSPR
2008 received a total of 175 paper submissions from many di?erent
countries around the world, thus giving the workshop an int-
national clout, as was the case for past workshops. This volume
contains 98 accepted papers: 56 for oral presentations and 42 for
poster presentations. In addition to parallel oral sessions for SPR
and SSPR, there was also one joint oral session with papers of
interest to both the SPR and SSPR communities. A recent trend that
has emerged in the pattern recognition and machine lea- ing
research communities is the study of graph-based methods that
integrate statistical andstructural approache
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