Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings (Paperback, 2014 ed.)

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Image Processing, Computer Vision, Pattern Recognition, and Graphics, 8621
Release date:	August 2014
First published:	2014
Editors:	Pasi Franti • Gavin Brown • Marco Loog • Francisco Escolano • Marcello Pelillo
Dimensions:	235 x 155 x 26mm (L x W x T)
Format:	Paperback
Pages:	478
Edition:	2014 ed.
ISBN-13:	978-3-662-44414-6
Categories:	Books > Computing & IT > General theory of computing > Data structures Books > Computing & IT > Computer programming > Algorithms & procedures Books > Computing & IT > Applications of computing > Pattern recognition Books > Computing & IT > Applications of computing > Databases > Data mining Books > Computing & IT > Applications of computing > Artificial intelligence > General
LSN:	3-662-44414-3
Barcode:	9783662444146

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