"Advances in Imaging and Electron Physics "features cutting-edge
articles on the physics of electron devices (especially
semiconductor devices), particle optics at high and low energies,
microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the
computing methods used in all these domains.
Key features:
* Contributions from leading authorities * Informs and updates
on all the latest developments in the field
General
| Imprint: |
Academic Press Inc
|
| Country of origin: |
United States |
| Series: |
Advances in Imaging and Electron Physics |
| Release date: |
June 2013 |
| First published: |
June 2013 |
| Series editors: |
Peter W. Hawkes
|
| Dimensions: |
229 x 152mm (L x W) |
| Format: |
Hardcover
|
| Pages: |
380 |
| Edition: |
165 Ed |
| ISBN-13: |
978-0-12-407702-7 |
| Categories: |
Books >
Science & Mathematics >
Physics >
Nuclear structure physics
|
| LSN: |
0-12-407702-1 |
| Barcode: |
9780124077027 |
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