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Static Crosstalk-Noise Analysis - For Deep Sub-Micron Digital Designs (Paperback, Softcover reprint of the original 1st ed. 2004) Loot Price: R2,906
Discovery Miles 29 060
Static Crosstalk-Noise Analysis - For Deep Sub-Micron Digital Designs (Paperback, Softcover reprint of the original 1st ed....

Static Crosstalk-Noise Analysis - For Deep Sub-Micron Digital Designs (Paperback, Softcover reprint of the original 1st ed. 2004)

Pinhong Chen, Desmond A. Kirkpatrick, Kurt Keutzer

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Loot Price R2,906 Discovery Miles 29 060 | Repayment Terms: R272 pm x 12*

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As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios. This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including: -Spatial pruning - reducing aggressors to those in physical proximity, -Electrical pruning - reducing aggressors by electrical strength, -Temporal pruning - reducing aggressors using timing windows, -Functional pruning - reducing aggressors by Boolean functional analysis.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: May 2013
First published: 2004
Authors: Pinhong Chen • Desmond A. Kirkpatrick • Kurt Keutzer
Dimensions: 235 x 155 x 7mm (L x W x T)
Format: Paperback
Pages: 113
Edition: Softcover reprint of the original 1st ed. 2004
ISBN-13: 978-1-4757-7949-3
Categories: Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD)
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN: 1-4757-7949-6
Barcode: 9781475779493

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