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Static Crosstalk-Noise Analysis - For Deep Sub-Micron Digital Designs (Paperback, Softcover reprint of the original 1st ed. 2004)
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Static Crosstalk-Noise Analysis - For Deep Sub-Micron Digital Designs (Paperback, Softcover reprint of the original 1st ed. 2004)
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As the feature size decreases in deep sub-micron designs, coupling
capacitance becomes the dominant factor in total capacitance. The
resulting crosstalk noise may be responsible for signal integrity
issues and significant timing variation. Traditionally, static
timing analysis tools have ignored cross coupling effects between
wires altogether. Newer tools simply approximate the coupling
capacitance by a 2X Miller factor in order to compute the worst
case delay. The latter approach not only reduces delay calculation
accuracy, but can also be shown to underestimate the delay in
certain scenarios. This book describes accurate but conservative
methods for computing delay variation due to coupling. Furthermore,
most of these methods are computationally efficient enough to be
employed in a static timing analysis tool for complex integrated
digital circuits. To achieve accuracy, a more accurate computation
of the Miller factor is derived. To achieve both computational
efficiency and accuracy, a variety of mechanisms for pruning the
search space are detailed, including: -Spatial pruning - reducing
aggressors to those in physical proximity, -Electrical pruning -
reducing aggressors by electrical strength, -Temporal pruning -
reducing aggressors using timing windows, -Functional pruning -
reducing aggressors by Boolean functional analysis.
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