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Books > Professional & Technical > Energy technology & engineering > Electrical engineering

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CTL for Test Information of Digital ICs (Paperback, Softcover reprint of the original 1st ed. 2003) Loot Price: R2,970
Discovery Miles 29 700
CTL for Test Information of Digital ICs (Paperback, Softcover reprint of the original 1st ed. 2003): Rohit Kapur

CTL for Test Information of Digital ICs (Paperback, Softcover reprint of the original 1st ed. 2003)

Rohit Kapur

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Loot Price R2,970 Discovery Miles 29 700 | Repayment Terms: R278 pm x 12*

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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: April 2013
First published: 2002
Authors: Rohit Kapur
Dimensions: 235 x 155 x 10mm (L x W x T)
Format: Paperback
Pages: 173
Edition: Softcover reprint of the original 1st ed. 2003
ISBN-13: 978-1-4757-7800-7
Categories: Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD)
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN: 1-4757-7800-7
Barcode: 9781475778007

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