Design, Analysis and Test of Logic Circuits Under Uncertainty (Paperback, 2013 ed.)

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

General

Imprint:	Springer
Country of origin:	Netherlands
Series:	Lecture Notes in Electrical Engineering, 115
Release date:	October 2014
First published:	2013
Authors:	Smita Krishnaswamy • Igor L Markov • John P. Hayes
Dimensions:	235 x 155 x 7mm (L x W x T)
Format:	Paperback
Pages:	124
Edition:	2013 ed.
ISBN-13:	978-9400797987
Categories:	Books > Computing & IT > General theory of computing > Mathematical theory of computation Books > Computing & IT > General theory of computing > Systems analysis & design Books > Computing & IT > General theory of computing > Data structures Books > Computing & IT > Computer programming > Algorithms & procedures Books > Science & Mathematics > Mathematics > Applied mathematics > Mathematics for scientists & engineers Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
LSN:	9400797982
Barcode:	9789400797987

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