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Digital Noise Monitoring of Defect Origin (Hardcover, 2007 ed.) Loot Price: R3,004

Discovery Miles 30 040

Repayment Terms: R282 pm x 12*

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Digital Noise Monitoring of Defect Origin (Hardcover, 2007 ed.): Telman Aliev

Digital Noise Monitoring of Defect Origin (Hardcover, 2007 ed.)

Telman Aliev

Series: Lecture Notes in Electrical Engineering, 2

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Loot Price R3,004 Discovery Miles 30 040 | Repayment Terms: R282 pm x 12*

Expected to ship within 10 - 15 working days

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Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Lecture Notes in Electrical Engineering, 2
Release date:	July 2007
First published:	2007
Authors:	Telman Aliev
Dimensions:	235 x 155 x 14mm (L x W x T)
Format:	Hardcover
Pages:	224
Edition:	2007 ed.
ISBN-13:	978-0-387-71753-1
Categories:	Books > Science & Mathematics > Mathematics > Applied mathematics > General Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Promotions
LSN:	0-387-71753-6
Barcode:	9780387717531