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Transistor Level Modeling for Analog/RF IC Design (Hardcover, 2006 ed.) Loot Price: R3,126
Discovery Miles 31 260
Transistor Level Modeling for Analog/RF IC Design (Hardcover, 2006 ed.): Wladyslaw Grabinski, Bart Nauwelaers, Dominique...

Transistor Level Modeling for Analog/RF IC Design (Hardcover, 2006 ed.)

Wladyslaw Grabinski, Bart Nauwelaers, Dominique Schreurs

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Loot Price R3,126 Discovery Miles 31 260 | Repayment Terms: R293 pm x 12*

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The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor modeling. The first chapter lays out the 2/3D process and device simulations as an effective tool for a better understanding of the internal behavior of semiconductor structures and this with a focus on high-voltage MOSFET devices. Subsequently, the mainstream developments of both the PSP and the EKV models are discussed in detail. These physics-based MOSFET models are compared to the measurement-based models which are frequently used in RF applications. The comparison includes an overview of the relevant empirical models and measurement techniques. The following chapters include SOI-specific aspects, modeling enhancement of small geometry MOSFET devices and a survey of quantum effects in devices and circuits. Finally, an explanation of hardware description languages such as VHDL-AMS and Verilog-A is offered and shows the possibilities of the practical implementation and standardization of the different modeling methodologies found in the preceding chapters.

The variety of subjects and the high quality of content of this volume make it a reference document for researchers and users of MOSFET devices and models. The book can be recommended to everyone who is involved in compact model developments, numerical TCAD modeling, parameter extraction, space-level simulation or model standardization. The book will appeal equally to PhD students who want to understand the ins and outs of MOSFETs as well as to modeling designers working in the analog and high-frequency areas.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: March 2006
First published: 2006
Editors: Wladyslaw Grabinski • Bart Nauwelaers • Dominique Schreurs
Dimensions: 235 x 155 x 19mm (L x W x T)
Format: Hardcover
Pages: 294
Edition: 2006 ed.
ISBN-13: 978-1-4020-4555-4
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
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LSN: 1-4020-4555-7
Barcode: 9781402045554

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