In continuation of the FRINGE Workshop Series this Proceeding
contains all contributions presented at the 7. International
Workshop on Advanced Optical Imaging and Metrology. The FRINGE
Workshop Series is dedicated to the presentation, discussion and
dissemination of recent results in Optical Imaging and Metrology.
Topics of particular interest for the 7. Workshop are: - New
methods and tools for the generation, acquisition, processing, and
evaluation of data in Optical Imaging and Metrology (digital
wavefront engineering, computational imaging, model-based
reconstruction, compressed sensing, inverse problems solution) -
Application-driven technologies in Optical Imaging and Metrology
(high-resolution, adaptive, active, robust, reliable, flexible,
in-line, real-time) - High-dynamic range solutions in Optical
Imaging and Metrology (from macro to nano) - Hybrid technologies in
Optical Imaging and Metrology (hybrid optics, sensor and data
fusion, model-based solutions, multimodality) - New optical
sensors, imaging and measurement systems (integrated, miniaturized,
in-line, real-time, traceable, remote) Special emphasis is put on
new strategies, taking into account the active combination of
physical modeling, computer aided simulation and experimental data
acquisition. In particular attention is directed towards new
approaches for the extension of existing resolution limits that
open the gates to wide-scale metrology, ranging from macro to nano,
by considering dynamic changes and using advanced optical imaging
and sensor systems.
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