Self-Trapped Excitons discusses the structure and evolution of the
self-trapped exciton (STE) in a wide range of materials. It
includes a comprehensive review of experiments and extensive tables
of data. Emphasis is given throughout to the unity of the basic
physics underlying various manifestations of self-trapping, with
the theory being developed from a localized, atomistic perspective.
The topics treated in detail in relation to STE relaxation include
spontaneous symmetry breaking, lattice defect formation, radiation
damage, and electronic sputtering.
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