The book reports modeling and simulation techniques for
substrate noise coupling effects in RFICs and introduces isolation
structures and design guides to mitigate such effects with the
ultimate goal of enhancing the yield of RF and mixed signal SoCs.
The book further reports silicon measurements, and new test and
noise isolation structures. To the authors knowledge, this is the
first title devoted to the topic of substrate noise coupling in
RFICs as part of a large SoC.
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