Reliability And Radiation Effects In Compound Semiconductors (Hardcover)

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

General

Imprint:	World Scientific Publishing Co Pte Ltd
Country of origin:	Singapore
Release date:	April 2010
First published:	April 2010
Authors:	Allan H Johnston
Dimensions:	235 x 162 x 26mm (L x W x T)
Format:	Hardcover
Pages:	376
ISBN-13:	978-981-4277-10-5
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN:	981-4277-10-X
Barcode:	9789814277105

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