VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers (Paperback, 1st ed. 2022)

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Series:	Communications in Computer and Information Science, 1687
Release date:	December 2022
First published:	2022
Editors:	Ambika Prasad Shah • Sudeb Dasgupta • Anand Darji • Jaynarayan Tudu
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	596
Edition:	1st ed. 2022
ISBN-13:	978-3-03-121513-1
Categories:	Books > Computing & IT > Computer hardware & operating systems > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	3-03-121513-3
Barcode:	9783031215131

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