Reflection high-energy electron diffraction (RHEED) is the
analytical tool of choice for characterizing thin films during
growth by molecular beam epitaxy, since it is very sensitive to
surface structure and morphology. This book serves as an
introduction to RHEED for beginners and describes detailed
experimental and theoretical treatments for experts, explaining how
to analyze RHEED patterns. For beginners the principles of electron
diffraction are explained and many examples of the interpretation
of RHEED patterns are described. The second part of the book
contains detailed descriptions of RHEED theory. The third part
applies RHEED to the determination of surface structures, gives
detailed descriptions of the effects of disorder, and critically
reviews the mechanisms contributing to RHEED intensity
oscillations. This unified and coherent account will appeal to both
graduate students and researchers in the study of molecular beam
epitaxial growth.
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