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VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Paperback, 1st ed. 2017)
Loot Price: R3,188
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VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Paperback, 1st ed. 2017)
Series: Communications in Computer and Information Science, 711
Expected to ship within 10 - 15 working days
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This book constitutes the refereed proceedings of the 21st
International Symposium on VLSI Design and Test, VDAT 2017, held in
Roorkee, India, in June/July 2017. The 48 full papers presented
together with 27 short papers were carefully reviewed and selected
from 246 submissions. The papers were organized in topical sections
named: digital design; analog/mixed signal; VLSI testing; devices
and technology; VLSI architectures; emerging technologies and
memory; system design; low power design and test; RF circuits;
architecture and CAD; and design verification.
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