VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Paperback, 1st ed. 2017)

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

General

Imprint:	Springer Verlag, Singapore
Country of origin:	Singapore
Series:	Communications in Computer and Information Science, 711
Release date:	December 2017
First published:	2017
Editors:	Brajesh Kumar Kaushik • Sudeb Dasgupta • Virendra Singh
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	815
Edition:	1st ed. 2017
ISBN-13:	978-981-10-7469-1
Categories:	Books > Computing & IT > Computer hardware & operating systems > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	981-10-7469-0
Barcode:	9789811074691

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