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Advances in X-Ray Analysis - Volume 30 (Paperback, Softcover reprint of the original 1st ed. 1987) Loot Price: R1,746
Discovery Miles 17 460
Advances in X-Ray Analysis - Volume 30 (Paperback, Softcover reprint of the original 1st ed. 1987): Charles S. Barrett

Advances in X-Ray Analysis - Volume 30 (Paperback, Softcover reprint of the original 1st ed. 1987)

Charles S. Barrett

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Loot Price R1,746 Discovery Miles 17 460 | Repayment Terms: R164 pm x 12*

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The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2011
First published: 1987
Authors: Charles S. Barrett
Dimensions: 254 x 178 x 32mm (L x W x T)
Format: Paperback
Pages: 602
Edition: Softcover reprint of the original 1st ed. 1987
ISBN-13: 978-1-4612-9075-9
Categories: Books > Science & Mathematics > Physics > Atomic & molecular physics
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
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LSN: 1-4612-9075-9
Barcode: 9781461290759

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