This book provides an in-depth treatment of the instrumentation,
physical bases and applications of X-ray photoelectron spectroscopy
(XPS) and static secondary ion mass spectroscopy (SSIMS) with a
specific focus on the subject of polymeric materials. XPS and SSIMS
are widely accepted as the two most powerful techniques for polymer
surface chemical analysis, particularly in the context of
industrial research and problem solving. In this book, the
techniques of XPS and SSIMS are described and in each case the
author explains what type of information may be obtained. The book
also includes details of case studies emphasising the complementary
and joint application of XPS and SSIMS in the investigation of
polymer surface structure and its relationship to the properties of
the material. This book will be of value to academic and industrial
researchers interested in polymer surfaces and surface analysis.
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