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Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.) Loot Price: R2,624
Discovery Miles 26 240
Repayment Terms: R246 pm x 12*
Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong...

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.)

Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick De Ridder

Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics, 4109

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Loot Price R2,624 Discovery Miles 26 240 | Repayment Terms: R246 pm x 12*

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This book constitutes the refereed proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held jointly in Hong Kong, China in August 2006 as a satellite event of the 18th International Conference of Pattern Recognition, ICPR 2006.

The 38 revised full papers and 61 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 217 submissions. The papers are organized in topical sections on image analysis, vision, character recognition, bayesian networks, graph-based methods, similarity and feature extraction, image and video, vision, kernel-based methods, recognition and classification, similarity and feature extraction, document analysis, graph-based methods, recognition and classification, image analysis, facial image analysis, representation, feature selection, clustering, multiple classifier systems, recognition and classification, unsupervised learning, dimensionality, representation, biometrics, and applications.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics, 4109
Release date: August 2006
First published: 2006
Editors: Dit-Yan Yeung • James T. Kwok • Ana Fred • Fabio Roli • Dick De Ridder
Dimensions: 235 x 155 x 48mm (L x W x T)
Format: Paperback
Pages: 939
Edition: 2006 ed.
ISBN-13: 978-3-540-37236-3
Categories: Books > Computing & IT > Applications of computing > Pattern recognition
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LSN: 3-540-37236-9
Barcode: 9783540372363

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