Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.)

The 38 revised full papers and 61 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 217 submissions. The papers are organized in topical sections on image analysis, vision, character recognition, bayesian networks, graph-based methods, similarity and feature extraction, image and video, vision, kernel-based methods, recognition and classification, similarity and feature extraction, document analysis, graph-based methods, recognition and classification, image analysis, facial image analysis, representation, feature selection, clustering, multiple classifier systems, recognition and classification, unsupervised learning, dimensionality, representation, biometrics, and applications.

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