0
Your cart

Your cart is empty

Books > Computing & IT > Applications of computing > Pattern recognition

Buy Now

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.) Loot Price: R3,164
Discovery Miles 31 640
Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong...

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.)

Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick De Ridder

Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics, 4109

 (sign in to rate)
Loot Price R3,164 Discovery Miles 31 640 | Repayment Terms: R297 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

This book constitutes the refereed proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held jointly in Hong Kong, China in August 2006 as a satellite event of the 18th International Conference of Pattern Recognition, ICPR 2006.

The 38 revised full papers and 61 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 217 submissions. The papers are organized in topical sections on image analysis, vision, character recognition, bayesian networks, graph-based methods, similarity and feature extraction, image and video, vision, kernel-based methods, recognition and classification, similarity and feature extraction, document analysis, graph-based methods, recognition and classification, image analysis, facial image analysis, representation, feature selection, clustering, multiple classifier systems, recognition and classification, unsupervised learning, dimensionality, representation, biometrics, and applications.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics, 4109
Release date: August 2006
First published: 2006
Editors: Dit-Yan Yeung • James T. Kwok • Ana Fred • Fabio Roli • Dick De Ridder
Dimensions: 235 x 155 x 48mm (L x W x T)
Format: Paperback
Pages: 939
Edition: 2006 ed.
ISBN-13: 978-3-540-37236-3
Categories: Books > Computing & IT > Applications of computing > Pattern recognition
LSN: 3-540-37236-9
Barcode: 9783540372363

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners