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Efficient Test Methodologies for High-Speed Serial Links (Hardcover, 2010 ed.) Loot Price: R3,612
Discovery Miles 36 120
Repayment Terms: R338 pm x 12*
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Efficient Test Methodologies for High-Speed Serial Links (Hardcover, 2010 ed.): Dongwoo Hong, Kwang-Ting Cheng

Efficient Test Methodologies for High-Speed Serial Links (Hardcover, 2010 ed.)

Dongwoo Hong, Kwang-Ting Cheng

Series: Lecture Notes in Electrical Engineering, 51

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Loot Price R3,612 Discovery Miles 36 120 | Repayment Terms: R338 pm x 12*

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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

General

Imprint: Springer
Country of origin: Netherlands
Series: Lecture Notes in Electrical Engineering, 51
Release date: December 2009
First published: 2010
Authors: Dongwoo Hong • Kwang-Ting Cheng
Dimensions: 235 x 155 x 7mm (L x W x T)
Format: Hardcover
Pages: 98
Edition: 2010 ed.
ISBN-13: 978-90-481-3442-7
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 90-481-3442-0
Barcode: 9789048134427

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