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Microelectronic Reliability, v. 1 - Reliability, Test and Diagnostics (Hardcover) Loot Price: R3,947
Discovery Miles 39 470
Repayment Terms: R370 pm x 12*
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Microelectronic Reliability, v. 1 - Reliability, Test and Diagnostics (Hardcover): Edward B. Hakim

Microelectronic Reliability, v. 1 - Reliability, Test and Diagnostics (Hardcover)

Edward B. Hakim

Series: Materials science library

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Loot Price R3,947 Discovery Miles 39 470 | Repayment Terms: R370 pm x 12*

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Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Materials science library
Release date: February 1989
First published: February 1989
Editors: Edward B. Hakim
Dimensions: 229 x 152 x 25mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 396
ISBN-13: 978-0-89006-284-5
Categories: Books > Professional & Technical > Electronics & communications engineering > General
LSN: 0-89006-284-6
Barcode: 9780890062845

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