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Microelectronic Reliability, v. 2 - Integrity, Assessment and Assurance (Hardcover) Loot Price: R4,058
Discovery Miles 40 580
Repayment Terms: R380 pm x 12*
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Microelectronic Reliability, v. 2 - Integrity, Assessment and Assurance (Hardcover): Emiliano Pollino

Microelectronic Reliability, v. 2 - Integrity, Assessment and Assurance (Hardcover)

Emiliano Pollino

Series: Electronic Materials & Devices Library

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Loot Price R4,058 Discovery Miles 40 580 | Repayment Terms: R380 pm x 12*

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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Electronic Materials & Devices Library
Release date: April 1989
First published: April 1989
Editors: Emiliano Pollino
Dimensions: 229 x 152 x 34mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 556
ISBN-13: 978-0-89006-350-7
Categories: Books > Professional & Technical > Electronics & communications engineering > General
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LSN: 0-89006-350-8
Barcode: 9780890063507

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