This book provides readers with a single-source guide to fabricate,
characterize and model memristor devices for sensing applications.
The authors describe a correlated, physics-based model to simulate
and predict the behavior of devices fabricated with different oxide
materials, active layer thickness, and operating temperature. They
discuss memristors from various perspectives, including working
mechanisms, different synthesis methods, characterization
procedures, and device employment in radiation sensing and security
applications.
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