Computed Tomography Principles, Design, Artifacts, and Recent Advances (Hardcover, 2nd Edition)

Six years after its first edition, "Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Second Edition" provides and updated overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Given the high visibility and public awareness of the impact of x-ray radiation, the second edition features a new chapter on x-ray dose and presents different dose reduction techniques ranging from patient handling, optimal data acquisition, image reconstruction, and postprocess. Based on the advancements over the past six years, the second edition includes new sections on cone beam reconstruction algorithms, nonconventional helical acquisition and reconstruction, new reconstruction approaches, and dual-energy CT. Finally, new to this edition is a set of problems for each chapter, providing opportunities to enhance reader comprehension and practice the application of covered material.

General

Imprint:	John Wiley & Sons
Country of origin:	United States
Release date:	December 2009
First published:	July 2009
Authors:	J Hsieh
Dimensions:	234 x 156 x 32mm (L x W x T)
Format:	Hardcover - Cloth over boards
Pages:	574
Edition:	2nd Edition
ISBN-13:	978-0-470-56353-3
Categories:	Books > Professional & Technical > Electronics & communications engineering > General Books > Professional & Technical > Biochemical engineering > Biotechnology > General Promotions
LSN:	0-470-56353-2
Barcode:	9780470563533

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