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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering

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Response Data Compression Techniques in Digital Circuit Testing (Paperback) Loot Price: R1,456
Discovery Miles 14 560
Repayment Terms: R136 pm x 12*
Response Data Compression Techniques in Digital Circuit Testing (Paperback): Jaber Al-Balushi, Afaq Ahmad

Response Data Compression Techniques in Digital Circuit Testing (Paperback)

Jaber Al-Balushi, Afaq Ahmad

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Loot Price R1,456 Discovery Miles 14 560 | Repayment Terms: R136 pm x 12*

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General

Imprint: Lap Lambert Academic Publishing
Country of origin: United States
Release date: November 2014
Authors: Jaber Al-Balushi • Afaq Ahmad
Dimensions: 229 x 152 x 6mm (L x W x T)
Format: Paperback - Trade
Pages: 96
ISBN-13: 978-3-659-23961-8
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General
LSN: 3-659-23961-5
Barcode: 9783659239618

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