The book provides a comprehensive overview of electromigration and
its effects on the reliability of electronic circuits. It
introduces the physical process of electromigration, which gives
the reader the requisite understanding and knowledge for adopting
appropriate counter measures. A comprehensive set of options is
presented for modifying the present IC design methodology to
prevent electromigration. Finally, the authors show how specific
effects can be exploited in present and future technologies to
reduce electromigration's negative impact on circuit reliability.
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