This work will educate chip and system designers on a method for
accurately predicting circuit and system reliability in order to
estimate failures that will occur in the field as a function of
operating conditions at the chip level. This book will combine the
knowledge taught in many reliability publications and illustrate
how to use the knowledge presented by the semiconductor
manufacturing companies in combination with the HTOL end-of-life
testing that is currently performed by the chip suppliers as part
of their standard qualification procedure and make accurate
reliability predictions. This book will allow chip designers to
predict FIT and DPPM values as a function of operating conditions
and chip temperature so that users ultimately will have control of
reliability in their design so the reliability and performance will
be considered concurrently with their design.
The ability to include reliability calculations and test results
in their product design
The ability to use reliability data provided to them by their
suppliers to make meaningful reliability predictions
Have accurate failure rate calculations for calculating warrantee
period replacement costs."
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