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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.) Loot Price: R4,156
Discovery Miles 41 560
Repayment Terms: R389 pm x 12*
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Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.): Lawrence C. Wagner

Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.)

Lawrence C. Wagner

Series: The Springer International Series in Engineering and Computer Science, 494

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Loot Price R4,156 Discovery Miles 41 560 | Repayment Terms: R389 pm x 12*

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

General

Imprint: Chapman and Hall
Country of origin: United Kingdom
Series: The Springer International Series in Engineering and Computer Science, 494
Release date: 1999
First published: 1999
Editors: Lawrence C. Wagner
Dimensions: 235 x 155 x 17mm (L x W x T)
Format: Hardcover
Pages: 255
Edition: 1999 ed.
ISBN-13: 978-0-412-14561-2
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
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LSN: 0-412-14561-8
Barcode: 9780412145612

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