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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.) Loot Price: R4,505

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Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.): Lawrence C. Wagner

Failure Analysis of Integrated Circuits - Tools and Techniques (Hardcover, 1999 ed.)

Lawrence C. Wagner

Series: The Springer International Series in Engineering and Computer Science, 494

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Loot Price R4,505 Discovery Miles 45 050 | Repayment Terms: R422 pm x 12*

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

General

Imprint:	Chapman and Hall
Country of origin:	United Kingdom
Series:	The Springer International Series in Engineering and Computer Science, 494
Release date:	1999
First published:	1999
Editors:	Lawrence C. Wagner
Dimensions:	235 x 155 x 17mm (L x W x T)
Format:	Hardcover
Pages:	255
Edition:	1999 ed.
ISBN-13:	978-0-412-14561-2
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors Promotions
LSN:	0-412-14561-8
Barcode:	9780412145612