The progression developed in this book is essential to understand
new test methodologies, algorithms and industrial practices.
Without the insight into the physics of nano-metric technologies,
it would be hard to develop system-level test strategies that yield
a high IC fault coverage. Obviously, the work on defect-oriented
testing presented in the book is not final, and it is an evolving
field with interesting challenges imposed by the ever-changing
nature of nano-metric technologies. Test and design practitioners
from academia and industry will find that Defect-Oriented Testing
for Nano-Metric CMOS VLSI Circuits lays the foundations for further
pioneering work.
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