This book describes techniques for how to verify and debug VLSI
designs when bugs are found after the chips are fabricated and used
in the field. This is the first book to cover many aspects of
post-silicon verification and debugging techniques that utilize
high-level design information, such as design descriptions in
C/C++. Using high-level analysis on the error traces generated by
fabricated chips maximizes the efficiency of the verification and
debugging techniques presented in this book. Experimental results
are included for real applications of the techniques presented.
General
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