Advanced Laser Diode Reliability focuses on causes and effects of
degradations of state-of-the-art semiconductor laser diodes. It
aims to provide a tool for linking practical measurements to
physical diagnostics. To this purpose, it reviews the current
technologies, addressing their peculiar details that can promote
specific failure mechanisms. Two sections will support this kernel:
a) Failure Analysis techniques, procedures and examples; b)
Device-oriented laser modelling and parameter extraction.
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