Discusses terminology associated with orientations, texture, and
their representation, as well as the diffraction of radiation, a
phenomenon that is the basis for almost all texture analysis.
Covers data acquisition, as well as representation and evaluation
related to the well-established methods of macrotexture analysis.
Updated to include experimental details of the latest transmission
or scanning electron microscope-based techniques for microstructure
analysis, including EBSD. Describes how microtexture data are
evaluated and represented and emphasizes the advances in
orientation microscopy and mapping, and advanced issues concerning
crystallographic aspects of interfaces and connectivity. Offers new
and innovative grain boundary descriptions and examples.
General
Imprint: |
Taylor & Francis
|
Country of origin: |
United Kingdom |
Release date: |
December 2023 |
First published: |
2024 |
Authors: |
Olaf Engler
• Stefan Zaefferer
• Valerie Randle
|
Dimensions: |
234 x 156mm (L x W) |
Pages: |
600 |
Edition: |
3rd edition |
ISBN-13: |
978-1-03-218942-0 |
Categories: |
Books
|
LSN: |
1-03-218942-8 |
Barcode: |
9781032189420 |
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