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High Performance Memory Testing - Design Principles, Fault Modeling and Self-Test (Hardcover, 2003 ed.) Loot Price: R4,524
Discovery Miles 45 240
High Performance Memory Testing - Design Principles, Fault Modeling and Self-Test (Hardcover, 2003 ed.): R. Dean Adams

High Performance Memory Testing - Design Principles, Fault Modeling and Self-Test (Hardcover, 2003 ed.)

R. Dean Adams

Series: Frontiers in Electronic Testing, 22A

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Loot Price R4,524 Discovery Miles 45 240 | Repayment Terms: R424 pm x 12*

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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 22A
Release date: September 2002
First published: September 2002
Authors: R. Dean Adams
Dimensions: 235 x 155 x 15mm (L x W x T)
Format: Hardcover
Pages: 250
Edition: 2003 ed.
ISBN-13: 978-1-4020-7255-0
Categories: Books > Computing & IT > Computer hardware & operating systems > Storage media & peripherals
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 1-4020-7255-4
Barcode: 9781402072550

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