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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components

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Design and Test Technology for Dependable Systems-on-Chip (Hardcover) Loot Price: R4,675
Discovery Miles 46 750
Design and Test Technology for Dependable Systems-on-Chip (Hardcover): Raimund Ubar

Design and Test Technology for Dependable Systems-on-Chip (Hardcover)

Raimund Ubar

Series: Advances in Computer and Electrical Engineering

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Loot Price R4,675 Discovery Miles 46 750 | Repayment Terms: R438 pm x 12*

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Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined classical design and test topics and solutions for IC test technology and fault-tolerant systems.

General

Imprint: IGI Global
Country of origin: United States
Series: Advances in Computer and Electrical Engineering
Release date: March 2011
First published: March 2011
Editors: Raimund Ubar
Dimensions: 280 x 216 x 31mm (L x W x T)
Format: Hardcover
Pages: 350
ISBN-13: 978-1-60960-212-3
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 1-60960-212-9
Barcode: 9781609602123

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