This book contains extended and revised versions of the best
papers that were presented during the thirteenth edition of the
IFIP TC 10 International Conference on Very Large Scale
Integration, a Global System-on-Chip Design and CAD conference.
The purpose of this conference is to provide a forum to exchange
ideas and show industrial and academic research results in the
field of microelectronics design. The current trend toward
increasing chip integration and technology process advancements
brings about stimulating new challenges both at the physical and
system-design levels, as well as in the test of these systems.
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