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Books > Science & Mathematics > Science: general issues > Scientific standards

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Noncontact Atomic Force Microscopy (Paperback, Softcover reprint of the original 1st ed. 2002) Loot Price: R5,626

Discovery Miles 56 260

Repayment Terms: R527 pm x 12*

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Noncontact Atomic Force Microscopy (Paperback, Softcover reprint of the original 1st ed. 2002): S. Morita, Roland Wiesendanger,...

Noncontact Atomic Force Microscopy (Paperback, Softcover reprint of the original 1st ed. 2002)

S. Morita, Roland Wiesendanger, E Meyer

Series: NanoScience and Technology

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Loot Price R5,626 Discovery Miles 56 260 | Repayment Terms: R527 pm x 12*

Expected to ship within 10 - 15 working days

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NanoScience and Technology
Release date:	October 2012
First published:	2002
Editors:	S. Morita • Roland Wiesendanger • E Meyer
Dimensions:	235 x 155 x 24mm (L x W x T)
Format:	Paperback
Pages:	440
Edition:	Softcover reprint of the original 1st ed. 2002
ISBN-13:	978-3-642-62772-9
Categories:	Books > Science & Mathematics > Science: general issues > Scientific standards Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Promotions
LSN:	3-642-62772-2
Barcode:	9783642627729