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Books > Science & Mathematics > Science: general issues > Scientific standards
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Noncontact Atomic Force Microscopy (Paperback, Softcover reprint of the original 1st ed. 2002)
Loot Price: R5,917
Discovery Miles 59 170
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Noncontact Atomic Force Microscopy (Paperback, Softcover reprint of the original 1st ed. 2002)
Series: NanoScience and Technology
Expected to ship within 10 - 15 working days
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Since 1995, the noncontact atomic force microscope (NC-AFM) has
achieved remarkable progress. Based on nanomechanical methods, the
NC-AFM detects the weak attractive force between the tip of a
cantilever and a sample surface. This method has the following
characteristics: it has true atomic resolution; it can measure
atomic force interactions, i.e. it can be used in so-called atomic
force spectroscopy (AFS); it can also be used to study insulators;
and it can measure mechanical responses such as elastic
deformation. This is the first book that deals with all of the
emerging NC-AFM issues.
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