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Nanoscale Phenomena in Ferroelectric Thin Films (Hardcover, 2004 ed.)
Loot Price: R5,604
Discovery Miles 56 040
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Nanoscale Phenomena in Ferroelectric Thin Films (Hardcover, 2004 ed.)
Series: Multifunctional Thin Film Series
Expected to ship within 10 - 15 working days
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This book presents the recent advances in the field of nanoscale
science and engineering of ferroelectric thin films. It comprises
two main parts, i.e. electrical characterization in nanoscale
ferroelectric capacitor, and nano domain manipulation and
visualization in ferroelectric materials. Well known
le'adingexperts both in relevant academia and industry over the
world (U.S., Japan, Germany, Switzerland, Korea) were invited to
contribute to each chapter. The first part under the title of
electrical characterization in nanoscale ferroelectric capacitors
starts with Chapter 1, "Testing and characterization of
ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The
author provides a comprehensive review on basic concepts and
terminologies of ferroelectric properties and their testing
methods. This chapter also covers reliability issues in FeRAMs that
are crucial for commercialization of high density memory products.
In Chapter 2, "Size effects in ferroelectric film capacitors: role
ofthe film thickness and capacitor size," Dr. I. Stolichnov
discusses the size effects both in in-plane and out-of-plane
dimensions of the ferroelectric thin film. The author successfully
relates the electric performance and domain dynamics with proposed
models of charge injection and stress induced phase transition. The
author's findings present both a challenging problem and the clue
to its solution of reliably predicting the switching properties for
ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric
thin films for memory applications: nanoscale characterization by
scanning force microscopy," Prof. A."
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