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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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ESD Testing - From Components to Systems (Hardcover)
Loot Price: R2,914
Discovery Miles 29 140
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ESD Testing - From Components to Systems (Hardcover)
Expected to ship within 18 - 22 working days
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With the evolution of semiconductor technology and global
diversification of the semiconductor business, testing of
semiconductor devices to systems for electrostatic discharge (ESD)
and electrical overstress (EOS) has increased in importance. ESD
Testing: From Components to Systems updates the reader in the new
tests, test models, and techniques in the characterization of
semiconductor components for ESD, EOS, and latchup. Key features: *
Provides understanding and knowledge of ESD models and
specifications including human body model (HBM), machine model
(MM), charged device model (CDM), charged board model (CBM), cable
discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and
IEC 61000-4-5. * Discusses new testing methodologies such as
transmission line pulse (TLP), to very fast transmission line pulse
(VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP
(UF-TLP). * Describes both conventional testing and new testing
techniques for both chip and system level evaluation. * Addresses
EOS testing, electromagnetic compatibility (EMC) scanning, to
current reconstruction methods. * Discusses latchup
characterization and testing methodologies for evaluation of
semiconductor technology to product testing. ESD Testing: From
Components to Systems is part of the authors series of books on
electrostatic discharge (ESD) protection; this book will be an
invaluable reference for the professional semiconductor chip and
system-level ESD and EOS test engineer. Semiconductor device and
process development, circuit designers, quality, reliability and
failure analysis engineers will also find it an essential
reference. In addition, its academic treatment will appeal to both
senior and graduate students with interests in semiconductor
process, device physics, semiconductor testing and experimental
work.
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