Electromagnetic Compatibility of Integrated Circuits: Techniques
for Low Emission and Susceptibility focuses on the electromagnetic
compatibility of integrated circuits. The basic concepts, theory,
and an extensive historical review of integrated circuit emission
and susceptibility are provided. Standardized measurement methods
are detailed through various case studies. EMC models for the core,
I/Os, supply network, and packaging are described with applications
to conducted switching noise, signal integrity, near-field and
radiated noise. Case studies from different companies and research
laboratories are presented with in-depth descriptions of the ICs,
test set-ups, and comparisons between measurements and simulations.
Specific guidelines for achieving low emission and susceptibility
derived from the experience of EMC experts are presented. The
companion CD-ROM includes software illustrating key aspects of the
book and a collection of demo tools applicable to EMC analysis of
ICs.
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