0
Your cart

Your cart is empty

Books > Professional & Technical > Electronics & communications engineering

Buy Now

Mitigating Tin Whisker Risks - Theory and Practice (Hardcover) Loot Price: R3,119
Discovery Miles 31 190
Mitigating Tin Whisker Risks - Theory and Practice (Hardcover): T. Kato

Mitigating Tin Whisker Risks - Theory and Practice (Hardcover)

T. Kato

 (sign in to rate)
Loot Price R3,119 Discovery Miles 31 190 | Repayment Terms: R292 pm x 12*

Bookmark and Share

Expected to ship within 18 - 22 working days

Discusses the growth mechanisms of tin whiskers and the effective mitigation strategies necessary to reduce whisker growth risks This book covers key tin whisker topics, ranging from fundamental science to practical mitigation strategies. The text begins with a review of the characteristic properties of local microstructures around whisker and hillock grains to identify why these particular grains and locations become predisposed to forming whiskers and hillocks. The book discusses the basic properties of tin-based alloy finishes and the effects of various alloying elements on whisker formation, with a focus on potential mechanisms for whisker suppression or enhancement for each element. Tin whisker risk mitigation strategies for each tier of the supply chain for high reliability electronic systems are also described. * Discusses whisker formation factors including surface grain geometry, crystallographic orientation-dependent surface grain boundary structure, and the localization of elastic strain/strain energy density distribution * Examines how whiskers and hillocks evolve in time through real-time studies of whisker growth with the scanning electron microscope/focused ion beaming milling (SEM/FIB) * Covers characterization methods of tin and tin-based alloy finishes such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), and electron backscatter diffraction (EBSD) * Reviews theories of mechanically-induced tin whiskers with case studies using pure tin and other lead-free finishes shown to evaluate the pressure-induced tin whiskers Mitigating Tin Whisker Risks: Theory and Practice is intended for the broader electronic packaging and manufacturing community including: manufacturing engineers, packaging development engineers, as well as engineers and researchers in high reliability industries.

General

Imprint: John Wiley & Sons
Country of origin: United States
Release date: July 2016
First published: September 2013
Authors: T. Kato
Dimensions: 241 x 158 x 23mm (L x W x T)
Format: Hardcover - Cloth over boards
Pages: 272
ISBN-13: 978-0-470-90723-8
Categories: Books > Professional & Technical > Electronics & communications engineering > General
Promotions
LSN: 0-470-90723-1
Barcode: 9780470907238

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

Closing The Gap - The Fourth Industrial…
Tshilidzi Marwala Paperback R559 Discovery Miles 5 590
Android Boot Camp for Developers Using…
Corinne Hoisington Paperback R1,256 R1,170 Discovery Miles 11 700
Introduction To Communication Studies
George Angelopulo, Elizabeth Lubinga Paperback R458 Discovery Miles 4 580
Apple In China - The Capture Of The…
Patrick McGee Paperback R435 Discovery Miles 4 350
Industrial Electronics N4
Paperback R427 Discovery Miles 4 270
Industrial Electronics N6
Paperback R399 Discovery Miles 3 990
Mechatronic Components - Roadmap to…
Emin Faruk Kececi Paperback R2,819 Discovery Miles 28 190
Handbook of Electronic Assistive…
Ladan Najafi, Donna Cowan Paperback R3,599 R3,361 Discovery Miles 33 610
Nonlinear Kalman Filter for Multi-Sensor…
Jean-Philippe Condomines Hardcover R2,578 Discovery Miles 25 780
Advances in Imaging and Electron…
Peter W. Hawkes Hardcover R5,230 Discovery Miles 52 300
Advances in Imaging and Electron…
Peter W. Hawkes Hardcover R5,240 Discovery Miles 52 400
Electrical Properties of Materials
L. Solymar, D. Walsh, … Hardcover R3,475 Discovery Miles 34 750

See more

Partners