Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings (Paperback, 2002 ed.)

This book constitutes the refereed proceedings of the 9th International Workshop on Structural and Syntctic Pattern Recognition, SSPR 2002 and the 4th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2002 held jointly in Windsor, Ontario, Canada in August 2002.The 45 revised full papers and 35 poster papers presented together with three invited papers were carefully reviewed and selected from 116 submissions. The papers are organized in topical sections on graphs, grammars, and languages; graphs, strings, and grammars; documents and OCR; image shape analysis and application; density estimation and distribution models; multi classifiers and fusion; feature extraction and selection; general methodology; and image shape analysis and application.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Lecture Notes in Computer Science, 2396
Release date:	July 2002
First published:	2002
Editors:	Terry Caelli • Adnan Amin • Robert P.W. Duin • Mohamed Kamel • Dick De Ridder
Dimensions:	235 x 155 x 44mm (L x W x T)
Format:	Paperback
Pages:	866
Edition:	2002 ed.
ISBN-13:	978-3-540-44011-6
Categories:	Books > Computing & IT > Applications of computing > Pattern recognition
LSN:	3-540-44011-9
Barcode:	9783540440116

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