This book targets custom IC designers who are encountering
variation issues in their designs, especially for modern process
nodes at 45nm and below, such as statistical process variations,
environmental variations, and layout effects. It teaches them the
state-of-the-art in Variation-Aware Design tools, which help the
designer to analyze quickly the variation effects, identify the
problems, and fix the problems. Furthermore, this book describes
the algorithms and algorithm behavior/performance/limitations,
which is of use to designers considering these tools, designers
using these tools, CAD researchers, and CAD managers.
General
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