The topic of this monograph is the physical modeling of
heterostructure devices. A detailed discussion of physical models
and parameters for compound semiconductors is presented including
the relevant aspects of modern submicron heterostructure devices.
More than 25 simulation examples for different types of
Si(Ge)-based, GaAs-based, InP-based, and GaN-based heterostructure
bipolar transistors (HBTs) and high electron mobility transistors
(HEMTs) are given in comparison with experimental data from
state-of-the-art devices.
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