The rapid growth of the use of optoelectronic technology in
Information and Communications Technology (ICT) has seen a
complementary increase in the performance of such technologies. As
a result, optoelectronic technologies have replaced the technology
of electronic interconnections. However, the control of
manufacturing techniques for optoelectronic systems is more
delicate than that of microelectronic technologies. This practical
resource, divided into four chapters, examines several methods for
determining the reliability of infrared LED devices. The primary
interest of this book focuses on methods of extracting fundamental
parameters from the electrical and optical characterization of
specific zones in components. Failure mechanisms are identified
based on measured performance before and after aging tests.
Knowledge of failure mechanisms allows formulation of degradation
laws, which in turn allow an accurate lifetime distribution for
specific devices to be proposed.
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