Reliability, Robustness and Failure Mechanisms of LED Devices - Methodology and Evaluation (Hardcover)

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

General

Imprint:	ISTE Press Ltd - Elsevier Inc
Country of origin:	United Kingdom
Release date:	September 2016
First published:	2016
Authors:	Yannick Deshayes • Laurent Bechou
Dimensions:	229 x 152 x 15mm (L x W x T)
Format:	Hardcover
Pages:	172
ISBN-13:	978-1-78548-152-9
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors Promotions
LSN:	1-78548-152-5
Barcode:	9781785481529

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!