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Quantitative Microbeam Analysis provides a comprehensive
introduction to the field of quantitative microbeam analysis (MQA).
MQA is a technique used to analyze subatomic quantities of
materials blasted from a surface by a laser or particle beam,
providing information on the structure and composition of the
material. Contributed to by international experts, the book is
unique in the breadth of microbeam analytical techniques covered.
For each technique, it develops the theoretical background,
discusses practical details relating to choice of equipment, and
describes the current advances. The book highlights developments
relating to Auger electron spectroscopy in scanning electron
microscopes and transmission electron microscopes and advances in
surface analytical imaging and accelerated ion beam-surface
interactions.
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