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The Reference Model of Open Distributed Processing (RM-ODP) is an
international standard that provides a solid basis for describing
and building widely distributed systems and applications in a
systematic way. It stresses the need to build these systems with
evolution in mind by identifying the concerns of major stakeholders
and then expressing the design as a series of linked viewpoints.
Although RM-ODP has been a standard for more than ten years, many
practitioners are still unaware of it. Building Enterprise Systems
with ODP: An Introduction to Open Distributed Processing offers a
gentle pathway to the essential ideas that constitute ODP and shows
how these ideas can be applied when designing and building
challenging systems. It provides an accessible introduction to the
design principles for software engineers and enterprise architects.
The book also explains the benefits of using viewpoints to produce
simpler and more flexible designs and how ODP can be applied to
service engineering, open enterprise, and cloud computing. The
authors include guidelines for using the Unified Modeling Language
(TM) (UML) notation and for structuring and writing system
specifications. They elucidate how this fits into the model-driven
engineering tool chain via approaches, such as Model-Driven
Architecture (R) (MDA). They also demonstrate the power of RM-ODP
for the design and organization of complex distributed IT systems
in e-government, e-health, and energy and transportation
industries. All concepts and ideas in the book are illustrated
through a single running example that describes the IT support
needed by a medium-sized company as it grows and develops. Complete
UML models and more are available at http://theodpbook.lcc.uma.es/
The Reference Model of Open Distributed Processing (RM-ODP) is an
international standard that provides a solid basis for describing
and building widely distributed systems and applications in a
systematic way. It stresses the need to build these systems with
evolution in mind by identifying the concerns of major stakeholders
and then expressing the design as a series of linked viewpoints.
Although RM-ODP has been a standard for more than ten years, many
practitioners are still unaware of it. Building Enterprise Systems
with ODP: An Introduction to Open Distributed Processing offers a
gentle pathway to the essential ideas that constitute ODP and shows
how these ideas can be applied when designing and building
challenging systems. It provides an accessible introduction to the
design principles for software engineers and enterprise architects.
The book also explains the benefits of using viewpoints to produce
simpler and more flexible designs and how ODP can be applied to
service engineering, open enterprise, and cloud computing. The
authors include guidelines for using the Unified Modeling Language
(TM) (UML) notation and for structuring and writing system
specifications. They elucidate how this fits into the model-driven
engineering tool chain via approaches, such as Model-Driven
Architecture (R) (MDA). They also demonstrate the power of RM-ODP
for the design and organization of complex distributed IT systems
in e-government, e-health, and energy and transportation
industries. All concepts and ideas in the book are illustrated
through a single running example that describes the IT support
needed by a medium-sized company as it grows and develops. Complete
UML models and more are available at http://theodpbook.lcc.uma.es/
Optical imaging describes the behaviour of visible, ultraviolet,
and infrared radiation used in imaging techniques based on optical
principles. Reflection, refraction, interference, scattering,
transmission, polarisation and/or luminescence/fluorescence
processes are involved in the optical study of different materials,
organic, inorganic, natural or synthetic. In this book, the authors
discuss optical image analysis and determination of dispersed
multi-phase flow for simulation and control; optical imaging
applications for the study of cultural heritage artefacts; atomic
and magnetic force microscopy of semiconductor and semimagnetic
nanocrystals; imaging, spectroscopy and sensing with single and
coupled metallic nanoparticles; methods for suppressing random and
nonrandom noise in fluorescence imaging; and optical coherence
tomography.
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